Methodological development of topographic correction in 2D/3D ToF-SIMS images using AFM images
| Autor: | Jung, Seokwon, Lee, Nodo, Choi, Myungshin, Lee, Jungmin, Cho, Eunkyunng, Joo, Minho |
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| Zdroj: | In Applied Surface Science 28 February 2018 432 Part B:90-96 |
| Databáze: | ScienceDirect |
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