Decomposition of ultrathin LiF cathode underlayer in organic-based devices evidenced by ToF-SIMS depth profiling

Autor: Pakhomov, Georgy L., Drozdov, Mikhail N., Travkin, Vlad V., Bochkarev, Mikhail N.
Zdroj: In Applied Surface Science 15 November 2017 422:192-197
Databáze: ScienceDirect