Systematic investigation of the properties of TiO2 films grown by reactive ion beam sputter deposition

Autor: Bundesmann, C., Lautenschläger, T., Spemann, D., Finzel, A., Thelander, E., Mensing, M., Frost, F.
Zdroj: In Applied Surface Science 1 November 2017 421 Part B:331-340
Databáze: ScienceDirect