XPS and EELS characterization of Mn2SiO4, MnSiO3 and MnAl2O4

Autor: Grosvenor, A.P., Bellhouse, E.M., Korinek, A., Bugnet, M., McDermid, J.R.
Zdroj: In Applied Surface Science 30 August 2016 379:242-248
Databáze: ScienceDirect