The effect of post-annealing on Indium Tin Oxide thin films by magnetron sputtering method

Autor: Park, J.H., Buurma, C., Sivananthan, S., Kodama, R., Gao, W., Gessert, T.A.
Zdroj: In Applied Surface Science 15 July 2014 307:388-392
Databáze: ScienceDirect