Determination of non-uniform graphene thickness on SiC (0 0 0 1) by X-ray diffraction
| Autor: | Ruammaitree, A., Nakahara, H., Akimoto, K., Soda, K., Saito, Y. |
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| Zdroj: | In Applied Surface Science 1 October 2013 282:297-301 |
| Databáze: | ScienceDirect |
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