FTIR-ATR spectroscopy in thin film studies: The importance of sampling depth and deposition substrate
| Autor: | Laroche, G., Fitremann, J., Gherardi, N. |
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| Zdroj: | In Applied Surface Science 15 May 2013 273:632-637 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Laroche, G., Fitremann, J., Gherardi, N. |
|---|---|
| Zdroj: | In Applied Surface Science 15 May 2013 273:632-637 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect