Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1−xGex thin films
| Autor: | Cao, W., Masnadi, M., Eger, S., Martinson, M., Xiao, Q.-F., Hu, Y.-F., Baribeau, J.-M., Woicik, J.C., Hitchcock, A.P., Urquhart, S.G. |
|---|---|
| Zdroj: | In Applied Surface Science 15 January 2013 265:358-362 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect