FT IR spectroscopy of silicon oxide layers prepared with perchloric acid
| Autor: | Kopani, M., Mikula, M., Takahashi, M., Rusnák, J., Pinčík, E. |
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| Zdroj: | In Applied Surface Science 15 March 2013 269:106-109 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Kopani, M., Mikula, M., Takahashi, M., Rusnák, J., Pinčík, E. |
|---|---|
| Zdroj: | In Applied Surface Science 15 March 2013 269:106-109 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
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