Influence of multi-hit capability on quantitative measurement of NiPtSi thin film with laser-assisted atom probe tomography
| Autor: | Kinno, T., Akutsu, H., Tomita, M., Kawanaka, S., Sonehara, T., Hokazono, A., Renaud, L., Martin, I., Benbalagh, R., Sallé, B., Takeno, S. |
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| Zdroj: | In Applied Surface Science 15 October 2012 259:726-730 |
| Databáze: | ScienceDirect |
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