Investigation of the presence of metal droplets after pulsed InN and GaN epitaxial growth using atomic force microscopy and nanoindentation

Autor: Terziyska, Penka T., Butcher, Kenneth Scott Alexander, Alexandrov, Dimiter
Zdroj: In Applied Surface Science 1 October 2012 258(24):9997-10001
Databáze: ScienceDirect