Analysis of the surface state of epi-ready Ge wafers
| Autor: | Gabás, M., Palanco, S., Bijani, S., Barrigón, E., Algora, C., Rey-Stolle, I., García, I., Ramos-Barrado, J.R. |
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| Zdroj: | In Applied Surface Science 1 August 2012 258(20):8166-8170 |
| Databáze: | ScienceDirect |
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