Evolution of the Al2O3/Ge(1 0 0) interface for reactively sputter-deposited films submitted to postdeposition anneals

Autor: Bom, Nicolau Molina, Soares, Gabriel Vieira, Krug, Cristiano, Pezzi, Rafael Peretti, Baumvol, Israel Jacob Rabin, Radtke, Claudio
Zdroj: In Applied Surface Science 15 May 2012 258(15):5707-5711
Databáze: ScienceDirect