Structural and optical properties study of nanocrystalline Si (nc-Si) thin films deposited on porous aluminum by plasma enhanced chemical vapor deposition
| Autor: | Ghrib, M., Gaidi, M., Khedher, N., Ghrib, T., Salem, M. Ben, Ezzaouia, H. |
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| Zdroj: | In Applied Surface Science 15 February 2011 257(9):3998-4003 |
| Databáze: | ScienceDirect |
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