Raman microprobe spectroscopy measurements of residual stress distribution along blisters in Cr 2O 3 thin films
| Autor: | Kemdehoundja, M., Grosseau-Poussard, J.L., Dinhut, J.F. |
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| Zdroj: | In Applied Surface Science 2010 256(9):2719-2725 |
| Databáze: | ScienceDirect |
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