Application of X-ray photoelectron spectroscopy to characterization of Au nanoparticles formed by ion implantation into SiO 2
| Autor: | Takahiro, K., Oizumi, S., Morimoto, K., Kawatsura, K., Isshiki, T., Nishio, K., Nagata, S., Yamamoto, S., Narumi, K., Naramoto, H. |
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| Zdroj: | In Applied Surface Science 2009 256(4):1061-1064 |
| Databáze: | ScienceDirect |
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