Critical distance for secondary ion formation: Experimental SIMS measurements
| Autor: | Kudriavtsev, Y., Gallardo, S., Villegas, A., Ramirez, G., Asomoza, R. |
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| Zdroj: | In Applied Surface Science 2008 255(4):877-879 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Kudriavtsev, Y., Gallardo, S., Villegas, A., Ramirez, G., Asomoza, R. |
|---|---|
| Zdroj: | In Applied Surface Science 2008 255(4):877-879 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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