Accuracy of calibrated depth by delta-doped reference materials in shallow depth profiling

Autor: Tomita, M., Tanaka, H., Koike, M., Kinno, T., Hori, Y., Yoshida, N., Sasaki, T., Takeno, S.
Zdroj: In Applied Surface Science 2008 255(4):1311-1315
Databáze: ScienceDirect