Piezoelectric evaluation of ion beam etched Pb(Zr,Ti)O 3 thin films by piezoresponse force microscopy
| Autor: | Legrand, C., Da Costa, A., Desfeux, R., Soyer, C., Rèmiens, D. |
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| Zdroj: | In Applied Surface Science 2007 253(11):4942-4946 |
| Databáze: | ScienceDirect |
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