Simulation of X-ray diffraction profiles in multilayers by direct wave summation: Application to asymmetric reflections
| Autor: | Zamir, S., Steinberg, O., Lakin, E., Zolotoyabko, E. |
|---|---|
| Zdroj: | In Applied Surface Science 2006 253(1):118-123 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect