Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: The case of yttria stabilized zirconia epitaxially grown on sapphire
| Autor: | Boulle, A., Guinebretière, R., Masson, O., Bachelet, R., Conchon, F., Dauger, A. |
|---|---|
| Zdroj: | In Applied Surface Science 2006 253(1):95-105 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect