Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS)
| Autor: | De Mondt, R., Adriaensen, L., Vangaever, F., Lenaerts, J., Van Vaeck, L., Gijbels, R. |
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| Zdroj: | In Applied Surface Science 2006 252(19):6652-6655 |
| Databáze: | ScienceDirect |
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