Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS)

Autor: De Mondt, R., Adriaensen, L., Vangaever, F., Lenaerts, J., Van Vaeck, L., Gijbels, R.
Zdroj: In Applied Surface Science 2006 252(19):6652-6655
Databáze: ScienceDirect