Quantitative fundamental SIMS studies using 18O implant standards
| Autor: | Williams, Peter, Sobers, Richard C., Jr., Franzreb, Klaus, Lörinčík, Jan |
|---|---|
| Zdroj: | In Applied Surface Science 2006 252(19):6429-6432 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Williams, Peter, Sobers, Richard C., Jr., Franzreb, Klaus, Lörinčík, Jan |
|---|---|
| Zdroj: | In Applied Surface Science 2006 252(19):6429-6432 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect