High resolution hard X-ray photoemission using synchrotron radiation as an essential tool for characterization of thin solid films
| Autor: | Kim, J.J., Ikenaga, E., Kobata, M., Takeuchi, A., Awaji, M., Makino, H., Chen, P.P., Yamamoto, A., Matsuoka, T., Miwa, D., Nishino, Y., Yamamoto, T., Yao, T., Kobayashi, K. |
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| Zdroj: | In Applied Surface Science 2006 252(15):5602-5606 |
| Databáze: | ScienceDirect |
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