Structure of the SiC (0 0 0 1) 3 × 3 reconstruction studied by surface X-ray diffraction

Autor: Voegeli, W., Akimoto, K., Aoyama, T., Sumitani, K., Nakatani, S., Tajiri, H., Takahashi, T., Hisada, Y., Mukainakano, S., Zhang, X., Sugiyama, H., Kawata, H.
Zdroj: In Applied Surface Science 2006 252(15):5259-5262
Databáze: ScienceDirect