Atomic force microscopic characterization of films grown by inverse pulsed laser deposition
| Autor: | Égerházi, L., Geretovszky, Zs., Csákó, T., Szörényi, T. |
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| Zdroj: | In Applied Surface Science 2006 252(13):4661-4666 |
| Databáze: | ScienceDirect |
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