In situ monitoring and benchmarking in UHV of InP/GaAsSb heterointerface reconstructions prepared via MOVPE

Autor: Kollonitsch, Z., Schimper, H.-J., Seidel, U., Willig, F., Hannappel, T.
Zdroj: In Applied Surface Science 2006 252(12):4033-4038
Databáze: ScienceDirect