Study of hot-carrier-induced photon emission from 90 nm Si MOSFETs
| Autor: | Gurfinkel, M. *, Borenshtein, M., Margulis, A., Sade, S., Fefer, Y., Weizman, Y., Shapira, Yoram |
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| Zdroj: | In Applied Surface Science 2005 248(1):62-65 |
| Databáze: | ScienceDirect |
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