Depth profile and interface analysis in the nm-range
| Autor: | Oswald, S. *, Reiche, R., Zier, M., Baunack, S., Wetzig, K. |
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| Zdroj: | In Applied Surface Science 2005 252(1):3-10 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Oswald, S. *, Reiche, R., Zier, M., Baunack, S., Wetzig, K. |
|---|---|
| Zdroj: | In Applied Surface Science 2005 252(1):3-10 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect