Effect of evaporation on surface morphology of epitaxial ZnO films during postdeposition annealing
| Autor: | Kim, I.W., Doh, S.J., Kim, C.C., Je, Jung Ho *, Tashiro, J., Yoshimoto, M. |
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| Zdroj: | In Applied Surface Science 2005 241(1):179-182 |
| Databáze: | ScienceDirect |
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