New technique to characterise thin oxide films under electronic irradiation
Autor: | Liébault, J., Zarbout, K., Moya-Siesse, D., Bernardini, J., Moya, G. |
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Zdroj: | In Applied Surface Science 15 May 2003 212-213:809-814 |
Databáze: | ScienceDirect |
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