Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
| Autor: | Sadewasser, S., Glatzel, Th., Shikler, R., Rosenwaks, Y., Lux-Steiner, M.Ch. |
|---|---|
| Zdroj: | In Applied Surface Science 2003 210(1):32-36 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect