Imaging TOF-SIMS for the surface analysis of silver halide microcrystals
| Autor: | Lenaerts, J., Gijbels, R., Van Vaeck, L., Verlinden, G., Geuens, I. |
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| Zdroj: | In Applied Surface Science 2003 203:614-619 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Lenaerts, J., Gijbels, R., Van Vaeck, L., Verlinden, G., Geuens, I. |
|---|---|
| Zdroj: | In Applied Surface Science 2003 203:614-619 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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