TOF-SIMS characterization of industrial materials: from silicon wafer to polymer
| Autor: | Karen, Akiya, Man, Naoki, Shibamori, Takahiro, Takahashi, Kumiko |
|---|---|
| Zdroj: | In Applied Surface Science 2003 203:541-546 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
| Autor: | Karen, Akiya, Man, Naoki, Shibamori, Takahiro, Takahashi, Kumiko |
|---|---|
| Zdroj: | In Applied Surface Science 2003 203:541-546 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect