Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR
| Autor: | Eijt, S.W.H, Falub, C.V, van Veen, A, Schut, H, Mijnarends, P.E |
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| Zdroj: | In Applied Surface Science 2002 194(1):234-238 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Eijt, S.W.H, Falub, C.V, van Veen, A, Schut, H, Mijnarends, P.E |
|---|---|
| Zdroj: | In Applied Surface Science 2002 194(1):234-238 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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