Surface and interface of Ti(film)/SiC(substrate) system: a soft X-ray emission and photoemission electron microscopy study
Autor: | Labis, Joselito, Ohi, Akihiko, Kamezawa, Chihiro, Yoshida, Kenichi, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro |
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Zdroj: | In Applied Surface Science 2002 190(1):521-526 |
Databáze: | ScienceDirect |
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