Surface and interface of Ti(film)/SiC(substrate) system: a soft X-ray emission and photoemission electron microscopy study

Autor: Labis, Joselito, Ohi, Akihiko, Kamezawa, Chihiro, Yoshida, Kenichi, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro
Zdroj: In Applied Surface Science 2002 190(1):521-526
Databáze: ScienceDirect