Interface characterization of high-quality SrTiO 3 thin films on Si(100) substrates grown by molecular beam epitaxy
| Autor: | Ramdani, J *, Droopad, R, Yu, Z, Curless, J.A, Overgaard, C.D, Finder, J, Eisenbeiser, K, Hallmark, J.A, Ooms, W.J, Kaushik, V, Alluri, P, Pietambaram, S |
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| Zdroj: | In Applied Surface Science 2000 159:127-133 |
| Databáze: | ScienceDirect |
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