Ultrathin section preparation of phyllosilicates by Focused Ion Beam milling for quantitative analysis by TEM-EDX
| Autor: | Bourdelle, Franck, Parra, Teddy, Beyssac, Olivier, Chopin, Christian, Moreau, Florent |
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| Zdroj: | In Applied Clay Science May 2012 59-60:121-130 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect