TCAD simulations of humidity-induced breakdown of silicon sensors
| Autor: | Ninca, I-S., Bloch, I., Brüers, B., Fadeyev, V., Fernandez-Tejero, J., Jessiman, C., Keller, J., Klein, C.T., Koffas, T., Lacker, H.M., Li, P., Scharf, C., Staats, E., Ullan, M., Unno, Y. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, A October 2024 1067 |
| Databáze: | ScienceDirect |
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