Design of large scale sensors in 180 nm CMOS process modified for radiation tolerance

Autor:	Flores Sanz de Acedo, L., Asensi Tortajada, I., Barbero, M., Berdalovic, I., Bespin, C., Bortoletto, D., Buttar, C., Caicedo, I., Cardella, R., Dachs, F., Dao, V., Degerli, Y., Dyndal, M., Freeman, P., Habib, A., Hemperek, T., Hirono, T., Kugathasan, T., Moustakas, K., Munker, M., Pernegger, H., Piro, F., Riedler, P., Rymaszewski, P., Schioppa, E.J., Schwemling, P., Sharma, A., Argemi, L. Simon, Snoeys, W., Sanchez, C. Solans, Wang, T., Wermes, N.
Zdroj:	In Nuclear Inst. and Methods in Physics Research, A 11 November 2020 980
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect