Investigation of the thickness non-uniformity of the very thin silicon-strip detectors

Autor: Liu, Qiang, Ye, Yanlin, Li, Zhihuan, Lin, Chengjian, Jia, Huiming, Ge, Yucheng, Li, Qite, Lou, Jianling, Yang, Xiaofei, Yang, Biao, Feng, Jun, Zang, Hongliang, Chen, Zhiqiang, Liu, Yang, Liu, Wei, Chen, Sidong, Yu, Hanzhou, Li, Jingjing, Zhang, Yun, Yang, Feng, Yang, Lei, Ma, Nanru, Sun, Lijie, Wang, Dongxi
Zdroj: In Nuclear Inst. and Methods in Physics Research, A 21 July 2018 897:100-105
Databáze: ScienceDirect