Distribution of Te inclusions in a CdZnTe wafer and their effects on the electrical properties of fabricated devices
| Autor: | Hossain, A., Xu, L., Bolotnikov, A.E., Camarda, G.S., Cui, Y., Yang, G., Kim, K.-H., James, R.B. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, A 2011 652(1):146-148 |
| Databáze: | ScienceDirect |
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