Characterization of etch pit formation via the Everson-etching method on CdZnTe crystal surfaces from the bulk to the nanoscale
Autor: | Teague, Lucile C., Duff, Martine C., Cadieux, James R., Soundararajan, Raji, Shick, Charles R., Jr., Lynn, Kelvin G. |
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Zdroj: | In Nuclear Inst. and Methods in Physics Research, A 2011 652(1):178-182 |
Databáze: | ScienceDirect |
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