Dark-lifetime degradation of GaAs photo-cathode at higher temperature

Autor: Kuriki, M., Shonaka, C., Iijima, H., Kubo, D., Okamoto, H., Higaki, H., Ito, K., Yamamoto, M., Konomi, T., Okumi, S., Kuwahara, M., Nakanishi, T.
Zdroj: In Nuclear Inst. and Methods in Physics Research, A 2011 637(1) Supplement:S87-S90
Databáze: ScienceDirect