Spatial resolution analysis of micron resolution silicon pixel detectors based on beam and laser tests

Autor: Andricek, Ladislav, Doležal, Zdeněk, Drásal, Zbyněk, Fischer, Peter, Kodyš, Peter, Kohrs, Robert, Kvasnička, Peter, Mariñas, Carlos, Reuen, Lars, Rummel, Stefan, Schmieden, Kristof, Velthuis, Jaap J., Vos, Marcel
Zdroj: In Nuclear Inst. and Methods in Physics Research, A 2009 604(1):385-389
Databáze: ScienceDirect