Radiation hardness properties of full-3D active edge silicon sensors

Autor: Da Viá, C., Hasi, J., Kenney, C., Linhart, V., Parker, Sherwood, Slavicek, T., Watts, S.J., Bem, P., Horazdovsky, T., Pospisil, S.
Zdroj: In Nuclear Inst. and Methods in Physics Research, A 2008 587(2):243-249
Databáze: ScienceDirect