Production testing and quality assurance of CMS silicon microstrip tracker readout chips
| Autor: | Bainbridge, R., Barrillon, P. *, Hall, G., Leaver, J., Noah, E., Raymond, M., Bisello, D., Candelori, A., Kaminsky, A., Khomenkov, V., Stefanutti, L., Tessaro, M., French, M. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, A 2005 543(2):619-644 |
| Databáze: | ScienceDirect |
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