Visualization of heavy ion-induced charge production in a CMOS image sensor

Autor: Végh, J *, Kerek, A, Klamra, W, Molnár, J, Norlin, L.-O, Novák, D, Sanchez-Crespo, A, Van der Marel, J, Fenyvesi, A, Valastyán, I, Sipos, A
Zdroj: In Nuclear Inst. and Methods in Physics Research, A 2004 525(1):229-235
Databáze: ScienceDirect