Iridium thin films deposited via pulsed laser deposition for future applications as transition-edge sensors

Autor: Galeazzi, M. *, Chen, C., Cohn, J.L., Gundersen, J.O.
Zdroj: In Nuclear Inst. and Methods in Physics Research, A 11 March 2004 520(1-3):293-295
Databáze: ScienceDirect