Si/Ge x Si 1−x heterojunction bipolar transistors formed by Ge ion implantation in Si. Narrowing of band gap and base width

Autor: Lombardo, S. *, Spinella, C., Campisano, S.U., Pinto, A., Ward, P.
Zdroj: In Nuclear Inst. and Methods in Physics Research, B 1999 147(1):56-61
Databáze: ScienceDirect